Lanthanum-doped ceria (CeO2) thin films have attracted significant attention due to their promising electrochemical properties, making them suitable for various applications such as solid oxide fuel cells, oxygen sensors, and catalysis. This study aims to provide a comprehensive analysis of lanthanum-doped ceria thin films using various characterization techniques, including X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), electrochemical impedance spectroscopy (EIS), and X-ray photoelectron spectroscopy (XPS). This study investigates the structural properties of LaxCe(1-x)O2(1-x/2) thin films, prepared using pulsed laser deposition, with varying stoichiometry. XRD results indicate textured film growth with preferential [100] orientation of cubic crystalline fluorite for low La content (x?0.5), while x>0.5 had a random orientation. La doping expanded the fluorite structure, increasing lattice parameters from 5.42 Å for x=0 to 5.69 Å for x=0.7. UV-Raman spectroscopy showed that La content x=10 caused a more pronounced balance between Ce4+ and Ce3+ than any other samples. Impedance revealed a direct relationship between La content and resistance, indicating lower resistance with lower La content. These findings could lead to using Ce-La oxides thin films as catalysts for OCM in electrochemical reactors based on ceria.
Bem-vindo(a) aos Anais do VII NanoMat, evento organizado pela Pós-graduação em Nanociências e Materiais Avançados da Universidade Federal do ABC (UFABC) com o intuito de reunir e debater trabalhos desenvolvidos por alunos e pós-doutorandos em Materiais e áreas afins.
Comissão Organizadora
Pedro Alves da Silva Autreto
Andre Luiz Martins de Freitas
Aryane Tofanello
Comissão Científica
Ferramenta completa de submissão, avaliação e publicação de anais para eventos científicos.
